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System and method of improving electromagnetic radiation...

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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System and method to compensate for critical dimension...

Optics: measuring and testing – By polarized light examination – With polariscopes
Reexamination Certificate

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System and process for controlled removal of material to produce

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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System and process for detecting and monitoring surface defects

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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System for 3-D inspection of objects

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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System for analyzing surface characteristics with...

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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System for analyzing surface characteristics with...

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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System for and method of reducing change caused by motor...

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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System for automatically inspecting a flat workpiece for holes

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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System for controlling intensity of a beam of...

Optics: measuring and testing – By polarized light examination – With polariscopes
Reexamination Certificate

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System for detecting and locating surface discontinuity by a lig

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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System for detecting the position of observation spot

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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System for detecting the presence and location of at least one o

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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System for detecting the presence of deposited metals on solderi

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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System for detecting unevenness degree of surface of semiconduct

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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System for determination of a location in three dimensional spac

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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System for determining stokes parameters

Optics: measuring and testing – By polarized light examination
Reexamination Certificate

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System for implementing variable retarder capability in...

Optics: measuring and testing – By polarized light examination
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System for in-line monitoring of photo processing in VLSI fabric

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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System for locating a body in motion

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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