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Generic interface for an optical metrology system

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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Generic interface for an optical metrology system

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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Gloss measurement system

Optics: measuring and testing – By polarized light examination – Of surface reflection
Patent

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Hand-holdable contamination tester

Optics: measuring and testing – By polarized light examination – Of surface reflection
Patent

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High resolution ellipsometric apparatus

Optics: measuring and testing – By polarized light examination – Of surface reflection
Patent

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High signal-to-noise optical apparatus and method for glass bott

Optics: measuring and testing – By polarized light examination – Of surface reflection
Patent

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High spatial resolution ellipsometry device

Optics: measuring and testing – By polarized light examination – Of surface reflection
Patent

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High spatial resolution infrared ellipsometer

Optics: measuring and testing – By polarized light examination – Of surface reflection
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High-precision reflectometer

Optics: measuring and testing – By polarized light examination – Of surface reflection
Patent

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High-sensitivity reflection measurement apparatus

Optics: measuring and testing – By polarized light examination – Of surface reflection
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High-speed polarizing device and high-speed birefringence...

Optics: measuring and testing – By polarized light examination – Of surface reflection
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High-throughput chiral detector and methods for using same

Optics: measuring and testing – By polarized light examination – Of surface reflection
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Horizontal attenuated total reflection system

Optics: measuring and testing – By polarized light examination – Of surface reflection
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Horizontal attenuated total reflection system

Optics: measuring and testing – By polarized light examination – Of surface reflection
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Imaging apparatus and method

Optics: measuring and testing – By polarized light examination – Of surface reflection
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Imaging apparatus and method

Optics: measuring and testing – By polarized light examination – Of surface reflection
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Imaging ellipsometry

Optics: measuring and testing – By polarized light examination – Of surface reflection
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Imaging method and apparatus

Optics: measuring and testing – By polarized light examination – Of surface reflection
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Imaging polarimeter detector for measurement of small spacings

Optics: measuring and testing – By polarized light examination – Of surface reflection
Patent

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Imaging system using polarization effects to enhance image...

Optics: measuring and testing – By polarized light examination – Of surface reflection
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