Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate
2007-03-20
2007-03-20
Lauchman, Layla G. (Department: 2877)
Optics: measuring and testing
By polarized light examination
Of surface reflection
C356S445000, C436S805000
Reexamination Certificate
active
10847736
ABSTRACT:
An imaging method and apparatus are provided, including a light source emitting a polarized light beam, and an optical assembly including a control layer and/or a light reflection surface. The control layer advantageously allows for control over the properties of a generated evanescent wave to optimize an image of a specimen array within the evanescent wave. The light reflection surface includes coupling means used to couple a receptor/capture agent advantageously allowing for flexible control over receptor specific regions.
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Huaiyou Wang et
Kempen Lothar U.
Lieberman Robert A.
Ralin David
Rassman William
Shapiro Herbert
Lauchman Layla G.
MacPherson Kwok & Chen & Heid LLP
Maven Technologies LLC
Park David S.
Ton Tri
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