Optics: measuring and testing – By polarized light examination – Of surface reflection
Patent
1980-10-23
1983-04-26
Punter, William H.
Optics: measuring and testing
By polarized light examination
Of surface reflection
356364, G01N 2121
Patent
active
043811515
ABSTRACT:
A hand-holdable apparatus for testing, and a method of testing, a light-reflective surface for contamination. The apparatus and the method are based upon a novel "off null" ellipsometry technique by the use of which contamination of the surface is ascertained, if the intensity of light reflected by the surface being tested exceeds a predetermined threshold of intensity.
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Bockeris et al., "The Anodic Formation of Calomel Films on Mercury Electrodes-an Ellipsometric-Galvanostatic Study" Proc. Roy. Soc. (London) 1964, pp. 345-377.
Gottesfeld et al., "The Monitoring of Fast Changes in the Optical Properties of Electrode Surfaces with a Classical Ellipsometer", Surface Science, 44, 1974, pp. 377-388.
Smith, T. "NDT Techniques for the Prediction of Adhesive Failure Loci Prior to Bonding" Materials Evaluation, 33, 5-1975, pp. 101-106.
Sivertsen et al., "A Field Instrument for Water Vapour Measurements" Infrared Physics 15, & 5-1975, pp. 79-82.
Erlich Jacob N.
Punter William H.
Singer Donald J.
The United States of America as represented by the Secretary of
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