Optics: measuring and testing – By polarized light examination – Of surface reflection
Patent
1993-08-09
1995-08-22
Rosenberger, Richard A.
Optics: measuring and testing
By polarized light examination
Of surface reflection
356240, 356446, 250223B, G01J 400
Patent
active
054445353
ABSTRACT:
An optical photodetection apparatus for glass surface defect photodetection includes a source for directing light, as an incident beam thereof against a glass surface target, which source is selected to emit light at wavelengths substantially overlapping a target-glass-absorbed bandwidth. The apparatus further includes a first optical polarizer for polarizing light emitted from the source, such that the first optical polarizer passes a resultant, polarized, incident beam against a target glass surface. The detector comprises an at least one silicon photodetector, and further includes a second optical polarizer arranged in cross-polarized relation to the first optical polarizer. The detector is aligned in defect scattered light beam detecting relation relative to the incident beam, preferably at an angle in the Brewster range, and is operable to generate a detected signal in response to light scattered through defects in said target surface.
REFERENCES:
patent: 3653767 (1972-04-01), Liskowitz
patent: 4459023 (1984-07-01), Reich et al.
patent: 4902137 (1990-02-01), Krieg et al.
Kim Robert
Labatt Brewing Company Limited
Rosenberger Richard A.
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