LandOfFree - US Patents - Listing for Optics: measuring and testing,By polarized light examination,Of surface reflection

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Ellipsometric method and apparatus for studying physical propert

Optics: measuring and testing – By polarized light examination – Of surface reflection

Patent

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Ellipsometric method and control device for making a...

Optics: measuring and testing – By polarized light examination – Of surface reflection

Reexamination Certificate

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Ellipsometric microscope

Optics: measuring and testing – By polarized light examination – Of surface reflection

Patent

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Ellipsometry methods and apparatus using solid immersion...

Optics: measuring and testing – By polarized light examination – Of surface reflection

Reexamination Certificate

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Enhanced optical detection of minimum features using depolarizat

Optics: measuring and testing – By polarized light examination – Of surface reflection

Patent

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Enhancing polarized light microscopy

Optics: measuring and testing – By polarized light examination – Of surface reflection

Reexamination Certificate

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Entangled-photon ellipsometry

Optics: measuring and testing – By polarized light examination – Of surface reflection

Reexamination Certificate

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Evaluation method for thin film molecular orientation, evaluatio

Optics: measuring and testing – By polarized light examination – Of surface reflection

Patent

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Evaluation method of semiconductor layer, method for fabricating

Optics: measuring and testing – By polarized light examination – Of surface reflection

Patent

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Exposure system, test mask for monitoring polarization, and...

Optics: measuring and testing – By polarized light examination – Of surface reflection

Reexamination Certificate

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