Optics: measuring and testing – By polarized light examination – Of surface reflection
Patent
1999-09-07
2000-11-21
Font, Frank G.
Optics: measuring and testing
By polarized light examination
Of surface reflection
356445, 356237, G01N 2100, G01N 2155, G01J 400
Patent
active
061511161
ABSTRACT:
Dependency of the polarization state of a reflected infrared ray generated when an infrared ray in a fixed polarization state is incident on a sample thin film on incidence orientation is measured while rotating the sample thin film in a plane parallel to a surface thereof. Next, an optical anisotropy of the sample thin film is determined based on the dependency of the polarization state on the incidence orientation. Then, the state of molecular orientation in the sample thin film is determined based on the optical anisotropy.
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Font Frank G.
NEC Corporation
Rodriguez Armando
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