LandOfFree - US Patents - Listing for Optics: measuring and testing,By particle light scattering

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Angle measuring interferometer

Optics: measuring and testing – By particle light scattering – With photocell detection

Patent

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Angle sensitive interferometer and control method and apparatus

Optics: measuring and testing – By particle light scattering – With photocell detection

Patent

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Angular displacement measuring interferometer

Optics: measuring and testing – By particle light scattering – With photocell detection

Patent

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Angular michelson interferometer and optical wavemeter based on

Optics: measuring and testing – By particle light scattering – With photocell detection

Patent

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Apparatus and a method for high numerical aperture microscopic e

Optics: measuring and testing – By particle light scattering – With photocell detection

Patent

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Apparatus and associated methods of detecting optical carriers a

Optics: measuring and testing – By particle light scattering – With photocell detection

Patent

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Apparatus and method for characterizing an interfacial...

Optics: measuring and testing – By particle light scattering – With photocell detection

Reexamination Certificate

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Apparatus and method for characterizing ultrafast polarization v

Optics: measuring and testing – By particle light scattering – With photocell detection

Patent

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Apparatus and method for comparing optical bits

Optics: measuring and testing – By particle light scattering – With photocell detection

Patent

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Apparatus and method for detecting aerosol

Optics: measuring and testing – By particle light scattering – With photocell detection

Reexamination Certificate

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Apparatus and method for detecting the relative positional devia

Optics: measuring and testing – By particle light scattering – With photocell detection

Patent

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Apparatus and method for determination of wavelength

Optics: measuring and testing – By particle light scattering – With photocell detection

Patent

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Apparatus and method for determining the configuration of a refl

Optics: measuring and testing – By particle light scattering – With photocell detection

Patent

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Apparatus and method for determining the configuration of a refl

Optics: measuring and testing – By particle light scattering – With photocell detection

Patent

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