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Sagnac distributed sensor

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Sagnac loop interferometer

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Sagnac optical logic gate

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Sagnac/Michelson distributed sensing systems

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Sample cell for light scattering measurements

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Sample evaluating method by using thermal expansion displacement

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Sample evaluation by dust measuring

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Sample inspection using interference and/or correlation of scatt

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Sapphire optical fiber interferometer

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Scalable non-contact optical backscatter insertion probe

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Scanning force microscope with detector probe for the atomic res

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Scanning heterodyne acousto-optical interferometers

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Scanning interferometer

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Scanning interferometer control systems

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Scanning interferometer sensor system

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Scanning Michelson interferometer assembly

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Scanning pulsed profilometer

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Scanning sensor system including an FT-IR interferometer

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Scanning spectrometer

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Scattered light smoke detector

Optics: measuring and testing – By particle light scattering – With photocell detection
Reexamination Certificate

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