Optics: measuring and testing – By particle light scattering
Reexamination Certificate
2005-03-22
2005-03-22
Stafira, Michael P. (Department: 2877)
Optics: measuring and testing
By particle light scattering
C600S317000
Reexamination Certificate
active
06870620
ABSTRACT:
An apparatus embodying the invention includes a probe head with an interrogation surface that is intended to be positioned adjacent or pushed into contact with a target material or tissue. The probe head is constructed to have a plurality of interrogation devices arranged across the face of the interrogation surface. The probe head is also constructed so that the interrogation device can conform to a non-uniform or non-planar surface of the target tissue. In some embodiments, the interrogation surface may have a particular shape that conforms to the shape of a target material. In other embodiments, one or more portions of the interrogation surface could be movable with respect to the remaining portions so that the interrogation surface could be movable with respect to remaining portions so that the interrogation surface can thereby conform to a non-uniform surface. In still other embodiments, a plurality of separately moveable interrogation devices can be arranged across the interrogation surface. During a measurement process, the interrogation surface would be pressed into contact with the non-uniform surface to cause individual ones of the interrogation devices to move, thereby causing the probe head to conform to the non-uniform surface.
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Arche Glenn S.
Bambot Shabbir B.
Farquhar J. David
Faupel Mark L.
Harrell Tim
Fleshner & Kim LLP
Spectrx, Inc.
Stafira Michael P.
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