Apparatus and method for determining the configuration of a refl

Details Apparatus and method for determining the configuration of a refl Apparatus and method for determining the configuration of a refl

1979-05-29

1982-02-23

Corbin, John K.

Optics: measuring and testing

By particle light scattering

With photocell detection

356359, G01B 902

Patent

active

043166709

ABSTRACT:
Disclosed is a system for the precision, high speed, non-contacting measurement of the shapes of reflective surfaces. This system consists of multiple laser fringe pattern transmitters, a random access image dissector camera or receiver, and a computer analysis system. Three laser transmitters project three fringe patterns onto a specimen surface such that the coordinates of the surface of the specimen can be obtained with an image dissector camera, imaged on the specimen, by separate measurement of the reflection by the surface from each transmitter. The computer analysis system decides which picture elements (pixels) are of interest, directs the receiver to "look at" those pixels, directs a digitizer to interrogate alternately the input numbers that are proportional to the coordinates of the specimen point. In a similar manner the shape of the entire specimen surface can be characterized and stored in computer memory.

REFERENCES:
patent: 3943278 (1976-03-01), Ramsey, Jr.
patent: 4030830 (1977-06-01), Holly
patent: 4158507 (1979-06-01), Himmel
Collier et al., "Contour Generation", Optical Holography, pp. 444-453, 1971.
Varner, "Holographic Contouring: Alternatives and Applications", Eastman Kodak Co., 1971.
Zelenka et al., "Multiple-Index Holographic Contouring", Applied Optics, vol. 8, No. 7, pp. 1431-1434, 6/69.
Friesem et al., "Fringe Formation in Two-Wavelength Contour Holography", Applied Optics, _vol. 15, No. 12, pp. 3009-3020, 12/76.

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