Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1993-02-22
1996-02-13
Limanek, Robert P.
Optics: measuring and testing
By particle light scattering
With photocell detection
356352, 250237G, G01B 902, G01B 908
Patent
active
054915511
ABSTRACT:
A Fourier-transform (FT) infrared (IR) spectrometer includes a Michelson interferometer without an IR beam compensator. An input IR beam is directed through a substrate and a beamsplitter attached to the substrate for support, with the input IR beam divided by the beamsplitter into a first beam portion incident upon a fixed retroreflector and a second beam portion incident upon a movable retroreflector. The first and second beam portions are then recombined to provide an uncompensated output IR beam with an interference pattern which is directed onto a sample to provide an uncompensated interferogram. The uncompensated interferogram is converted from a time domain to a frequency domain via a Fourier-transform to provide a complex intermediate spectrum, followed by a calculation of a corrected phase angle in terms of wavenumber arising from the substrate's optical thickness. The complex intermediate spectrum is then rotated by a negative of the corrected phase angle. An inverse Fourier-transform is used to form a corrected real compensated intermediate interferogram. The corrected real compensated intermediate interferogram is then Fourier-transformed into a spectrum using a conventional approach to remove asymmetric noise and correct for small phase errors.
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Analytical Technology, Inc.
Limanek Robert P.
Williams Alexander Oscar
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