Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1997-02-24
1998-11-03
Turner, Samuel A.
Optics: measuring and testing
By particle light scattering
With photocell detection
385 14, G01B 902
Patent
active
058317317
ABSTRACT:
An optical bit error tester for testing an optical device. The optical bit error tester, in one embodiment, includes an optical bit pattern generator, an optical beam divider in communication with the optical bit pattern generator, the optical device being tested and an optical XOR gate. The optical XOR gate in one embodiment includes a first input port in communication with the beam divider and a second input port in communication with the optical device being tested. The optical XOR gate produces an output signal at its output port in response to changes introduced by the optical device under test in the optical bit pattern produced by the optical bit pattern generator. In one embodiment the optical XOR gate includes a non-linear optical loop mirror.
REFERENCES:
patent: 3781081 (1973-12-01), Rokos
patent: 4128300 (1978-12-01), Stotts et al.
patent: 4262992 (1981-04-01), Berthold, III
patent: 4762394 (1988-08-01), Kwong et al.
patent: 4991920 (1991-02-01), Peczalski
patent: 5165077 (1992-11-01), Rokugawa et al.
patent: 5208705 (1993-05-01), Avramopoulos et al.
patent: 5301008 (1994-04-01), Huang et al.
patent: 5307366 (1994-04-01), Auffret et al
patent: 5309267 (1994-05-01), Huang et al.
patent: 5353114 (1994-10-01), Hansen
patent: 5566261 (1996-10-01), Hall et al.
Jinno, M., et al., "Ultrafast all-optical logic operations in a nonlinear Sagnac interferometer with two control beams" vol. 16, No. 4 Optics Letters, pp. 220-222 (Feb. 15, 1991).
Jinno, M., et al. "Nonlinear Sagnac Interferometer Switch and Its Applications" vol. 28, No. 4 IEEE Journal of Quantum Electronics, pp. 875-882 (Apr., 1992).
Cotter, D., et al. "Algorithm for Binary Word Recognition Suited to Ultrafast Nonlinear Optics" No. 11 Electronics Letters (Mar. 8, 1993).
Cotter, et als. "Self-routing of 100 Gbit/s packets using 6 bit `Keyword` address recognition" Electronics Letters (Jun. 8, 1995).
Rogers, D.C., et als. "Demonstration of programmable optical pulse pattern generator for 100 Gbit/s networks" vol. 31, No. 23 Electronics Letters, pp. 2001-2002 (Nov. 9, 1995).
Hall, K.L., et al. "All-optical bit pattern generation and matching" vol. 32, No. 13 Electronics Letters, pp. 1214-1215 (Jun. 20, 1996).
Hall, K.L., et al. "All-optical bit pattern generation and matching at 10 Gbit/s" vol. 2 OFC pp. 133-134 (1996).
Hall Katherine L.
Rauschenbach Kristin A.
Massachusetts Institute of Technology
Turner Samuel A.
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