Apparatus and method for characterizing ultrafast polarization v

Details Apparatus and method for characterizing ultrafast polarization v Apparatus and method for characterizing ultrafast polarization v

1997-07-24

1999-08-10

Kim, Robert H.

Optics: measuring and testing

By particle light scattering

With photocell detection

356351, G01B 902

Patent

active

059367326

ABSTRACT:
Practical techniques are described for characterizing ultrafast potentially ultraweak, ultrashort optical pulses. The techniques are particularly suited to the measurement of signals from nonlinear optical materials characterization experiments, whose signals are generally too weak for full characterization using conventional techniques.

REFERENCES:
patent: 5530544 (1996-06-01), Trebino et al.
patent: 5684586 (1997-11-01), Fortenberry et al.
patent: 5754292 (1998-05-01), Kane et al.

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