Scalable non-contact optical backscatter insertion probe

Details Scalable non-contact optical backscatter insertion probe Scalable non-contact optical backscatter insertion probe

1996-11-05

1998-05-12

Nelms, David C.

Optics: measuring and testing

By particle light scattering

With photocell detection

356439, 356440, 356442, 356445, G01N 2100, G01N 2155

Patent

active

057514240

ABSTRACT:
A non-contact optical backscatter insertion probe includes an outer chamber, an electromagnetic energy source positioned within the outer chamber for emitting photons towards a medium to be analyzed, and an inner chamber positioned within the outer chamber. The inner chamber has a reflective outer surface to prevent photons emitted by the electromagnetic energy source in the outer chamber from entering the inner chamber. The probe also includes a sensor positioned within the inner chamber for receiving backscattered photons from the medium. The inner chamber provides the backscattered photons emitted from the medium to the sensor. A processor receives and processes signals output by the sensor. Similarly, a method for measuring optical backscatter from a medium to be analyzed includes the steps of providing an electromagnetic energy source positioned within an outer chamber of an optical backscatter probe to emit photons towards a medium to be analyzed; providing a sensor positioned within an inner chamber of the optical backscatter probe to receive backscattered photons from the medium wherein the inner chamber provides the backscattered photons emitted from the medium to the sensor; and processing signals output by the sensor.

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