Scanning spectrometer

Details Scanning spectrometer Scanning spectrometer

1978-09-20

1981-03-17

Evans, F. L.

Optics: measuring and testing

By particle light scattering

With photocell detection

350331R, 350267, 356330, G01B 902, G01J 328

Patent

active

042564050

ABSTRACT:
The dispersion means of the present scanning spectrometer comprises an interference filter or diffraction means to be positioned at a known angle to the optical axis of the input flux to the spectrometer. The spectrometer is provided with shutter means for passing the light to the filter or diffraction means through sequentially spatially varied locations in the shutter means, and with means for receiving and passing light from sequentially varied locations of the shutter means at varying, measurable angles of incidence to the filter or diffraction means. The shutter means may be a liquid crystal cell.

REFERENCES:
patent: 2823577 (1958-02-01), Machler
patent: 3437411 (1969-04-01), Rudomanski et al.
patent: 3554649 (1971-01-01), Ridgway
patent: 3961181 (1976-06-01), Golden

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