Scanning double-beam interferometer

Optics: measuring and testing – By light interference – Spectroscopy

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Reexamination Certificate

active

07342664

ABSTRACT:
Scanning interferometer and method of using same providing for rapid, reliable detection of chemical compounds that are readily implemented in low-cost, portable configurations for application in a variety of monitoring and detection applications. A scanning double-beam interferometer, particularly a Michelson interferometer, in which the length of at least one of the optical paths (or arms) of the interferometer is selectively adjustable by use of an actuator in which rotational displacement of a rotatable element is converted into linear displacement of at least one reflective surface which forms an end of an optical path of the interferometer is employed to obtain interferograms of electromagnetic radiation attenuated, emitted, scattered or reflected from a sample. The length of the optical path that is adjusted is determined using an optical detection scheme, particularly where marking on the rotatable element are detected to determine linear displacement of the reflective surface.

REFERENCES:
patent: 3922065 (1975-11-01), Schultz
patent: 4086652 (1978-04-01), Mantz
patent: 4795253 (1989-01-01), Sandridge et al.
patent: 5021941 (1991-06-01), Ford et al.
patent: 5331399 (1994-07-01), Tank et al.
patent: 5341207 (1994-08-01), Tank et al.
patent: 5486918 (1996-01-01), Nagashima
patent: 5675414 (1997-10-01), Rowell et al.
patent: 5917516 (1999-06-01), Nguyen et al.
patent: 5949544 (1999-09-01), Manning
patent: 5998786 (1999-12-01), Movaghar et al.
patent: 6016207 (2000-01-01), Wield
patent: 0 411 250 (1990-04-01), None
Agladze et al. (Dec. 2004) “Miniaturization of Holographic Fourier-Transform Spectrometers,” Appl. Optics 43 (36):6568-6579.
Boer et al. (Apr. 2004) “Compact Liquid-Crystal-Polymer Fourier-Transform Spectrometer,” Appl. Optics 43 (11):2201-2208.
Collins et al. (Jun. 1999) “Fourier-Transform Optical Microsystems,” Optics Lett. 24(12):844-846.
Huang et al. (Dec. 2002) “Data Compression of High-Spectral Resolution Measurements,” SDR Conference for the Americas, Dec. 9-13, 2002, Miami, Florida.
Knipp et al. (Mar. 2005) “Silicon-Based Micro-Fourier Spectrometer,” IEEE Trans Electron. Dev. 52(3):419-426.
Kruzelecky et al. (2004) “Miniature High-Performance Infrared Spectrometer for Space Applications,” Proceedings of the 5th International Conference on Space Optics, Mar. 30-Apr. 2, 2004, Toulouse, France, pp. 203-210.
Lohninger, H. (1998) “Spectral Data Bases and Interpretation Systems,” OMPANA, Duisburg, Germany, http://www. lohninger.com/spectroscopy/dball.html.
Manzardo, O. (Aug. 2004) “Micromachining Yields Compact FT Spectrometers,” Photonics TechnologyWorld.
Manzardo, O. (2002) “Micro-Sized Fourier Spectometers,” Dissertation, Neuchantel University, France.
Manzardo et al. (Dec. 1999) “Miniaturized Time-Scanning Fourier Transform Spectrometer Based on Silicon Technology,” Optics Lett. 24(23):1705-1707.
Schilz, J. (2000) “Applications of Thermoelectric Infrared Sensors (Thermophiles): Gas Detection by Infrared Absorption; NDIR,” Perkin Elmer Thermophys. Min. 8(22).
Wallrabe et al. (2005) “Miniaturized Fourier Transform Spectrometer for the Near Infrared Wavelength Regime Incorporating and Electromagnetic Linear Actuator,” Sensors Actuators A 123-124:459-467.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Scanning double-beam interferometer does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Scanning double-beam interferometer, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Scanning double-beam interferometer will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3976857

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.