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Method and apparatus for optically measuring the volume of gener

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method and apparatus for production line screening

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Reexamination Certificate

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Method and apparatus for real-time, in-situ endpoint detection a

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method and apparatus for remote detection and thickness measurem

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method and apparatus for remote detection and thickness measurem

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method and apparatus for white-light dispersed-fringe interferom

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method and apparatus of determining the true edge length of a bo

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method and device for coin diameter discrimination

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method and device for contact-free interval or thickness measure

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method and device for controlling the film thickness of evaporat

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method and device for determining the area coverage of an origin

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method and device for determining the thickness and concentricit

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method and device for in situ stress measurement within a thin f

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method and device for measuring parts

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Reexamination Certificate

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Method and device for measuring the length of a light guide

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Reexamination Certificate

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Method and device for thickness assessment

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method and system for measuring an inner diameter of a hole form

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method for controlling the laying of a silicone string, particul

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method for detecting obstructed nozzles

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method for determining optical constants prior to film processin

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
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