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Reticle overlay correction

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Reexamination Certificate

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Reticle pre-alignment apparatus and method thereof

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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Robot-teaching cassette

Optics: measuring and testing – By alignment in lateral direction
Patent

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Rotational deviation detecting method and system using a periodi

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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Rotational stage with vertical axis adjustment

Optics: measuring and testing – By alignment in lateral direction
Reexamination Certificate

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Sample centering system

Optics: measuring and testing – By alignment in lateral direction – With light detector
Patent

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Scan exposure apparatus and method, and device manufacturing...

Optics: measuring and testing – By alignment in lateral direction
Reexamination Certificate

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Scan exposure apparatus and method, and device manufacturing...

Optics: measuring and testing – By alignment in lateral direction
Reexamination Certificate

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Scanning projection exposure method and projection exposure appa

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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Scanning type projection exposure apparatus and device...

Optics: measuring and testing – By alignment in lateral direction – With light detector
Reexamination Certificate

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Scanning unit for an optical position measuring system

Optics: measuring and testing – By alignment in lateral direction
Reexamination Certificate

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Scatterometry alignment for imprint lithography

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Reexamination Certificate

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Scatterometry target and method

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Reexamination Certificate

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Secondary alignment fiducials for automatic alignment using mach

Optics: measuring and testing – By alignment in lateral direction – With light detector
Patent

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See through laser alignment target device

Optics: measuring and testing – By alignment in lateral direction – With light detector
Patent

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Segmented bar-in-bar target

Optics: measuring and testing – By alignment in lateral direction
Patent

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Self-aligning sewer pipe laser

Optics: measuring and testing – By alignment in lateral direction
Patent

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Semiconductor chip position detector

Optics: measuring and testing – By alignment in lateral direction – With light detector
Patent

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Semiconductor device and alignment apparatus and alignment...

Optics: measuring and testing – By alignment in lateral direction
Reexamination Certificate

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Semiconductor manufacturing system with self-diagnosing function

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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