Optics: measuring and testing – By alignment in lateral direction – With light detector
Patent
1991-12-23
1994-04-26
Rosenberger, Richard A.
Optics: measuring and testing
By alignment in lateral direction
With light detector
356375, G01B 1100
Patent
active
053071549
ABSTRACT:
A semiconductor chip position detector including a transparent film on which semiconductor chips are placed, a film table on which the film is placed, a light source, optical fiber cables provided in the vicinity of the film table, by which light beams from the light source are radiated onto the semiconductor chips through the film having the semiconductor chips placed thereon, and a position recognition device provided above the film for recognizing the positions of the semiconductor chips based on shadow shapes of the semiconductor chips generated by the radiated light.
REFERENCES:
patent: 4515479 (1985-05-01), Pryor
patent: 4575637 (1986-03-01), Sullivan, Jr.
patent: 4647208 (1987-03-01), Bieman
Naemura Junichi
Okanishi Mamoru
Yamazaki Masao
Hantis K. P.
Rosenberger Richard A.
Sharp Kabushiki Kaisha
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