Optics: measuring and testing – By alignment in lateral direction – With light detector
Patent
1986-11-12
1988-07-05
Laroche, Eugene R.
Optics: measuring and testing
By alignment in lateral direction
With light detector
356399, 356401, G01B 1100
Patent
active
047550538
ABSTRACT:
Apparatus and method are provided for reducing processing time for aligning two parts by machine vision. The prior art approach of utilizing a substrate (b 14) with two spaced-apart targets (16a, 16b) and a top-plate (10) with two primary alignment openings (b 12a, 12b) spaced apart the same distance as the targets is improved by providing a set of fiducials (a pair of secondary openings (18a, 18b) or a pair of marks (18'a, 18'b) on the surface) in the top-plate. As a consequence of the novel approach, the vision system is not confused by the similar reflectivities of the target and the top-plate as the substrate and top-plate are brought into contact. Accordingly, alignment may be readily rechecked after assembly.
REFERENCES:
patent: 3744914 (1973-07-01), Gonda
patent: 4326805 (1982-04-01), Feldman et al.
patent: 4367046 (1983-01-01), Lacombat
Frankie Thomas T.
Levinson Mitchell E.
Bethurum William J.
Hewlett--Packard Company
LaRoche Eugene R.
McCutcheon Nathan W.
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