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Sample manipulating apparatus

Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate

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Sample operation apparatus

Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate

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Sampling scanning probe microscope and sampling method thereof

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

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Scan type probe microscope

Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate

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Scanner beam dynamic deflection measurement system and method

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

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Scanner for probe microscopy

Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate

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Scanning apparatus linearization and calibration system

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

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Scanning apparatus linearization and calibration system

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

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Scanning atomic force microscope

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

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Scanning device

Measuring and testing – Surface and cutting edge testing
Reexamination Certificate

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Scanning evanescent electro-magnetic microscope

Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate

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Scanning evanescent electro-magnetic microscope

Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate

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Scanning force microscope

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

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Scanning force microscope

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

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Scanning force microscope and method for beam detection and...

Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate

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Scanning force microscope probe cantilever with reflective...

Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate

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Scanning force microscope using an optical trap

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

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Scanning force microscope with automatic surface engagement

Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate

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Scanning force microscope with automatic surface engagement and

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

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Scanning force microscope with beam tracking lens

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

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