Scanner beam dynamic deflection measurement system and method

Measuring and testing – Surface and cutting edge testing – Roughness

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73 179, 73 181, 356381, 356382, 364563, 364568, G01N 2186, G01N 3700

Patent

active

057737142

ABSTRACT:
In a scanner used in a paper-making process to measure basis weight and other parameters of the fabricated paper sheet, variations in the separation of an opposed pair of sensing heads due to temperature induced deflections of upper and lower beams on which the heads are movably mounted as well as deflections and/or expansions of other portions of the support structure for the sensor are dynamically measured and compensated for. Temperature sensors mounted on carriages for the sensing heads measure the temperatures at different locations within the sensor support structure so that temperature differentials can be determined. The temperature differentials, which provide a measure of beam deflection at any given position of the head carrying carriage, are applied in accordance with a linearizing algorithm to correct the values provided by the sensing heads. A plurality of temperature sensors mounted on each carriage provide temperature differences between upper and lower portions and between opposite side portions of an associated beam so that beam deflection in both the vertical or Z direction and the lateral or X direction can be compensated for. Temperature sensors are also located on opposite faces of end support plates which support the upper and lower beams, to provide a measure of temperature induced deflection and/or relative expansion of the end support plates.

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