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Test apparatus and electronic device

Data processing: measuring – calibrating – or testing – Testing system – Signal generation or waveform shaping
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Test apparatus and power supply circuit

Data processing: measuring – calibrating – or testing – Testing system – Signal generation or waveform shaping
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Test device for signaling and waveform generation and...

Data processing: measuring – calibrating – or testing – Testing system – Signal generation or waveform shaping
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Test device, test method and computer readable media

Data processing: measuring – calibrating – or testing – Testing system – Signal generation or waveform shaping
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Test signalling

Data processing: measuring – calibrating – or testing – Testing system – Signal generation or waveform shaping
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Timing closure for system on a chip using voltage drop based...

Data processing: measuring – calibrating – or testing – Testing system – Signal generation or waveform shaping
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Timing closure for system on a chip using voltage drop based...

Data processing: measuring – calibrating – or testing – Testing system – Signal generation or waveform shaping
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Timing generator, and timing generating method

Data processing: measuring – calibrating – or testing – Testing system – Signal generation or waveform shaping
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Versatile semiconductor manufacturing controller with...

Data processing: measuring – calibrating – or testing – Testing system – Signal generation or waveform shaping
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Video camera for photographing animated images

Data processing: measuring – calibrating – or testing – Testing system – Signal generation or waveform shaping
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Waveform generating device

Data processing: measuring – calibrating – or testing – Testing system – Signal generation or waveform shaping
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