Test apparatus and power supply circuit

Details Test apparatus and power supply circuit Test apparatus and power supply circuit

2007-06-26

2007-06-26

Barlow, John (Department: 2863)

Data processing: measuring, calibrating, or testing

Testing system

Signal generation or waveform shaping

Reexamination Certificate

active

11081803

ABSTRACT:
A power circuit which can reduce power consumption. More specifically, a testing apparatus for testing an electronic device which includes: a pattern generation unit for generating a test pattern which is supplied to the electronic device; a power supply circuit for supplying power to the electronic device; and a decision unit for deciding pass/fail of the electronic device based on an output signal output from the electronic device, wherein the power supply circuit has: a voltage source for generating a predetermined input voltage to be applied to the electronic device; a power device for supplying the power to the electronic device based on the input voltage generated by the voltage source; a power supply for supplying drive power of the power device; and a voltage control unit for controlling a drive voltage applied by the power supply to the power device based on the power output from the power device.

REFERENCES:
patent: 2002/0175662 (2002-11-01), Sakurai et al.
patent: 2004/0113601 (2004-06-01), Hashimoto
patent: 2006/0071682 (2006-04-01), Hashimoto
patent: 6-65912 (1994-09-01), None
patent: 2002-238429 (2002-08-01), None
patent: 2003-111396 (2003-04-01), None
International Search Report issued for International application No. PCT/JP2005/021839 mailed on Feb. 28, 2006 and partial English translation thereof, 13 pages.

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