Test apparatus and electronic device

Details Test apparatus and electronic device Test apparatus and electronic device

2007-03-23

2009-11-24

Nghiem, Michael P. (Department: 2863)

Data processing: measuring, calibrating, or testing

Testing system

Signal generation or waveform shaping

Reexamination Certificate

active

07623984

ABSTRACT:
There is provided a test apparatus for testing a device under test. The test apparatus includes first and second period generators that respectively generate test period signals indicating test periods for testing the device under test, a plurality of input/output sections that are provided in correspondence with a plurality of terminals of the device under test, wherein each of the plurality of input/output sections, in accordance with a test period supplied thereto, outputs a test signal to a corresponding one of the plurality of terminals and receives an output signal output from the corresponding terminal, and a plurality of selecting sections that are provided in correspondence with the plurality of input/output sections, wherein each of the plurality of selecting sections selects one of the test period signals generated by the first and second period generators so as to be supplied to a corresponding one of the plurality of input/output sections.

REFERENCES:
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patent: 2004/0251924 (2004-12-01), Sudou
patent: 2007/0203659 (2007-08-01), Yamaguchi et al.
patent: 2007/0266290 (2007-11-01), Yamada et al.
patent: 2008/0232538 (2008-09-01), Goishi
patent: 09096663 (1997-04-01), None
patent: 2003-057318 (2003-02-01), None

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