4. Data processing: measuring, calibrating, or testing
  5. Measurement system
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Self-correcting barometer and/or altimeter

Data processing: measuring – calibrating – or testing – Measurement system – Pressure
Reexamination Certificate

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Self-diagnosing system for encoder

Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation
Reexamination Certificate

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Self-diagnostic testing of a network interface adapter

Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation
Reexamination Certificate

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Self-implementing diagnostic system

Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation
Patent

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Self-learning integrity management system and related methods

Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation
Reexamination Certificate

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Self-learning integrity management system and related methods

Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation
Reexamination Certificate

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Self-propelled harvesting machine and operating method therefor

Data processing: measuring – calibrating – or testing – Measurement system – Article count or size distribution
Reexamination Certificate

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Self-referential method and apparatus for creating stimulus...

Data processing: measuring – calibrating – or testing – Measurement system – Measured signal processing
Reexamination Certificate

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Semi-definite programming method for ad hoc network node...

Data processing: measuring – calibrating – or testing – Measurement system – Orientation or position
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Semiconductor device and noise measuring method

Data processing: measuring – calibrating – or testing – Measurement system – Measured signal processing
Reexamination Certificate

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Semiconductor device having variable parameter selection...

Data processing: measuring – calibrating – or testing – Measurement system – Temperature measuring system
Reexamination Certificate

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Semiconductor device, and test circuit and test method for...

Data processing: measuring – calibrating – or testing – Measurement system – Weight
Reexamination Certificate

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Semiconductor fabricating apparatus

Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation
Reexamination Certificate

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Semiconductor inspecting apparatus

Data processing: measuring – calibrating – or testing – Measurement system – Remote supervisory monitoring
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Semiconductor integrated circuit

Data processing: measuring – calibrating – or testing – Measurement system – Orientation or position
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Semiconductor integrated circuit

Data processing: measuring – calibrating – or testing – Measurement system – Temperature measuring system
Reexamination Certificate

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Semiconductor integrated circuit device

Data processing: measuring – calibrating – or testing – Measurement system – Temperature measuring system
Reexamination Certificate

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Semiconductor manufacturing system having a bar-code interface

Data processing: measuring – calibrating – or testing – Measurement system – Remote supervisory monitoring
Patent

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Semiconductor memory device having on die thermal sensor

Data processing: measuring – calibrating – or testing – Measurement system – Temperature measuring system
Reexamination Certificate

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Semiconductor processing techniques

Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation
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