Semiconductor inspecting apparatus

Details Semiconductor inspecting apparatus Semiconductor inspecting apparatus

2008-04-09

2011-10-04

Bui, Bryan (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system

Remote supervisory monitoring

C714S738000

Reexamination Certificate

active

08032332

ABSTRACT:
A semiconductor inspecting apparatus includes: a buffer memory whose width is matched to the greater of parallel bus width and the width of the number of serial lanes; a preceding stage bus switching unit that fills the buffer memory with input data without making a free space; equivalent transmission capacity conversion including a following stage bus switching unit that fills read data to the width of an arbitrary number of serial lanes without making a free space; a preceding stage bus switching unit that fills a buffer memory with input data without making a free space; and equivalent transmission capacity inverse conversion including a following stage bus switching unit that fills a parallel bus of arbitrary width with data read from a buffer memory without making a free space.

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“SerialLite Megacore Function User Guide”, Altera Corp., http://www.altera.com/literature/ug/ug—sl.pdf, Aug. 2005 (especially refer to p. 3-8).
“Aurora Protocol Specification”, Xilinx Inc., http://www.xilinx.com/aurora/aurora—protocol—member/aurora—protocol—spec—sp002.pdf, Jun. 2004 (especially refer to p. 56).

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