Data processing: measuring – calibrating – or testing – Measurement system – Temperature measuring system
Reexamination Certificate
2011-03-01
2011-03-01
Khuu, Cindy Hien-Dieu (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system
Temperature measuring system
Reexamination Certificate
active
07899643
ABSTRACT:
A semiconductor integrated circuit device which consumes less power and enables real-time processing. The semiconductor integrated circuit device includes thermal sensors which detect temperature and determine whether the detection result exceeds reference values and output the result, and a control block capable of controlling the operations of arithmetic blocks based on the output signals of the thermal sensors. The control block returns to an operation state from a suspended state with an interrupt signal based on the output signals of the thermal sensors and determines the operation conditions of the arithmetic blocks to ensure that the temperature conditions of the arithmetic blocks are satisfied. Thereby, power consumption is reduced and real-time processing efficiency is improved.
REFERENCES:
patent: 5963079 (1999-10-01), Hoang
patent: 7180211 (2007-02-01), Sinha et al.
patent: 7216064 (2007-05-01), Pippin
patent: 7427158 (2008-09-01), Yoshida
patent: 7434985 (2008-10-01), Hsu et al.
patent: 2003/0212474 (2003-11-01), Pippin
patent: 2004/0047099 (2004-03-01), Pippin
patent: 2005/0071116 (2005-03-01), Kim
patent: 2006/0012930 (2006-01-01), Oh et al.
patent: 2006/0129881 (2006-06-01), Furuichi et al.
patent: 2006/0161375 (2006-07-01), Duberstein et al.
patent: 2007/0106428 (2007-05-01), Omizo et al.
patent: 2007/0140030 (2007-06-01), Wyatt
patent: 2008/0022140 (2008-01-01), Yamada et al.
patent: 2008/0039981 (2008-02-01), Wyatt et al.
patent: 2008/0091378 (2008-04-01), Jeong et al.
patent: 1 615 134 (2006-01-01), None
patent: 2006-018758 (2006-01-01), None
patent: 2006-146605 (2006-06-01), None
Kanno Yusuke
Misaka Satoshi
Osada Kenichi
Saen Makoto
Yamada Tetsuya
Khuu Cindy Hien-Dieu
Miles & Stockbridge P.C.
Renesas Electronics Corporation
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