Semiconductor memory device having on die thermal sensor

Details Semiconductor memory device having on die thermal sensor Semiconductor memory device having on die thermal sensor

2007-06-29

2009-10-27

Dunn, Drew A (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system

Temperature measuring system

C702S099000, C327S513000, C327S538000

Reexamination Certificate

active

07610165

ABSTRACT:
A semiconductor memory device includes: a temperature information output unit for measuring an internal temperature of the semiconductor memory device, and generating a plurality of flag signals, each voltage level of which varies according to the measured internal temperature; a self-refresh oscillation unit for providing a self-refresh period corresponding to the measured internal temperature in response to the plurality of flag signals; and a temperature information control unit for determining a measuring period of the temperature information output unit in response to a temperature sensing enable signal and the plurality of flag signals.

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Korean Office Action, with English Translation, issued in corresponding Korean Patent Application No. 10-2006-0107889, mailed on Nov. 20, 2007.
Korean Notice of Allowance issued in Korean Patent Application No. KR 10-2006-0107889, dated on Feb. 1, 2008.

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