Semiconductor integrated circuit

Details Semiconductor integrated circuit Semiconductor integrated circuit

2011-08-16

2011-08-16

Lau, Tung S (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system

Orientation or position

Reexamination Certificate

active

08000923

ABSTRACT:
A semiconductor integrated circuit according to the examples of the present invention is applied to a system using a first power source voltage and a second power source voltage independent of the first power source voltage and includes a first area to which the first power source voltage is supplied, a thermal sensor placed in the first area, and a first input path placed in the first area, for transferring trimming data that determine the control contents of the thermal sensor to the thermal sensor.

REFERENCES:
patent: 5956289 (1999-09-01), Norman et al.
patent: 6002627 (1999-12-01), Chevallier
patent: 6006169 (1999-12-01), Sandhu et al.
patent: 2003/0034851 (2003-02-01), Norman et al.
patent: 2003/0158697 (2003-08-01), Gold et al.
patent: 2004/0071191 (2004-04-01), Sim et al.
patent: 2000-55742 (2000-02-01), None
patent: WO 2005/001405 (2005-01-01), None
Michael L. Dunbar, Single Chip ASICs for Smart Sensor Signal conditioning, 1998 IEEE, p. 44-50.
http://mw1.merriam-webster.com/dictionary/calibrate, p. 1.

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