Self-learning integrity management system and related methods

Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation

Reexamination Certificate

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Details

C702S187000, C702S185000, C702S181000, C714S037000, C714S047300

Reexamination Certificate

active

08060342

ABSTRACT:
An integrity management system predicts abnormalities in complex systems before they occur based upon the prior history of abnormalities within the complex system. A topology of the nodes of a complex system is generated and data is collected from the system based on predetermined metrics. In combination with dynamic thresholding, fingerprints of the relevant nodes within a complex system at various time intervals prior to the occurrence of the abnormality are captured and weighted. The fingerprints can then be applied to real-time data to provide alerts of potential abnormality prior to their actual occurrence.

REFERENCES:
patent: 5067099 (1991-11-01), McCown et al.
patent: 5835902 (1998-11-01), Jannarone
patent: 5838242 (1998-11-01), Marsden
patent: 6216119 (2001-04-01), Jannarone
patent: 6289330 (2001-09-01), Jannarone
patent: 6327677 (2001-12-01), Garg et al.
patent: 6427102 (2002-07-01), Ding
patent: 6453346 (2002-09-01), Garg et al.
patent: 6591255 (2003-07-01), Tatum et al.
patent: 6609083 (2003-08-01), Enck et al.
patent: 6647377 (2003-11-01), Jannarone
patent: 7032119 (2006-04-01), Fung
patent: 7107339 (2006-09-01), Wolters
patent: 7296070 (2007-11-01), Sweeney et al.
patent: 7333851 (2008-02-01), Echauz et al.
patent: 7453052 (2008-11-01), Midgley
patent: 7467067 (2008-12-01), Marvasti
patent: 7519564 (2009-04-01), Horvitz
patent: 7801703 (2010-09-01), Marvasti
patent: 2005/0177353 (2005-08-01), Slater
patent: 2006/0129606 (2006-06-01), Horvitz et al.
patent: 2007/0005297 (2007-01-01), Beresniewicz et al.
patent: 2007/0005761 (2007-01-01), Wolters
patent: 2007/0044082 (2007-02-01), Sauermann et al.
patent: 2007/0067678 (2007-03-01), Hosek et al.

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