Semiconductor device, and test circuit and test method for...

Details Semiconductor device, and test circuit and test method for... Semiconductor device, and test circuit and test method for...

2008-01-14

2010-12-14

Raymond, Edward (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system

Weight

Reexamination Certificate

active

07853430

ABSTRACT:
A semiconductor device includes a CDR (Clock Data Recovery) circuit and a frequency tracking control circuit. The CDR (Clock Data Recovery) circuit executes a clock data recovery on a serial data inputted synchronously with a spread spectrum clock. The frequency tracking control circuit controls a bandwidth of frequency which can be tracked by the CDR circuit.

REFERENCES:
patent: 7363563 (2008-04-01), Hissen et al.
patent: 2004/0252751 (2004-12-01), Ogasawara
patent: 2004/0252804 (2004-12-01), Aoyama
patent: 2005/0156586 (2005-07-01), Kanbayashi
patent: 2006/0056564 (2006-03-01), Takeuchi
patent: 2005-4451 (2005-01-01), None
patent: 2005-5999 (2005-01-01), None
patent: 2005-233933 (2005-09-01), None
Korean Patent Office issued a Korean Office Action dated Nov. 25, 2009, Application No. 520020416681.

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