Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate
2007-04-03
2010-11-02
Bryant, Kiesha R (Department: 2891)
Active solid-state devices (e.g., transistors, solid-state diode
Test or calibration structure
C117S902000
Reexamination Certificate
active
07825409
ABSTRACT:
A GaN crystal substrate has a crystal growth surface on which a crystal is grown, and a rear surface opposite to the crystal growth surface. The crystal growth surface has a roughness Ra(C)of at most 10 nm, and the rear surface has a roughness Ra(R)of at least 0.5 μm and at most 10 μm. A ratio Ra(R)/Ra(C)of the surface roughness Ra(R)to the surface roughness Ra(C)is at least 50. Thus, a GaN crystal substrate of which front and rear surfaces are distinguishable from each other is provided, without impairing the morphology of a semiconductor layer grown on the GaN crystal substrate.
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Extended European Search Report issued in European Patent Application No. EP 07005725.2-1215/1842942, dated May 25, 2009.
Fujita Shunsuke
Kasai Hitoshi
Bryant Kiesha R
McDermott Will & Emery LLP
Naraghi Ali
Sumitomo Electric Industries Ltd.
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