Grounding inserts

Details Grounding inserts Grounding inserts

2005-03-01

2005-03-01

Coleman, W. David (Department: 2823)

Active solid-state devices (e.g., transistors, solid-state diode

Test or calibration structure

C324S765010, C438S014000

Reexamination Certificate

active

06861667

ABSTRACT:
A grounding assembly for testing which can be readily changed is provided by an insert which is retained within an opening in a test socket. Flexible projections from the socket fit within grooves in the insert to provide the retention means. The insert is positioned within an opening in the socket adjacent to an opening containing a device under test (DUT). The insert is also between the DUT and a test board, and has contacts arranged such they connect ground contacts on the DUT to opposing contacts on the test board. The insert can provide different numbers, arrangements, and types of contacts as well as different materials for both the contact and contact body by merely changing the insert.

REFERENCES:
patent: 5578870 (1996-11-01), Farnsworth et al.
patent: 5639247 (1997-06-01), Johnson et al.
patent: 5834838 (1998-11-01), Anderson
patent: 6078186 (2000-06-01), Hembree et al.
patent: 6168449 (2001-01-01), Huang et al.
patent: 6262581 (2001-07-01), Han
patent: 20010025957 (2001-10-01), Takahashi

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