LandOfFree - US Patents - Listing for X-ray or gamma ray systems or devices,Specific application

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

X-ray quanta measuring device including diaphragm for producing

X-ray or gamma ray systems or devices – Specific application – Computerized tomography

X-ray radiographic apparatus for medical use

X-ray or gamma ray systems or devices – Specific application – Absorption

X-ray radiographic method of recognition of materials and...

X-ray or gamma ray systems or devices – Specific application – Absorption

X-ray radiography for container inspection

X-ray or gamma ray systems or devices – Specific application – Lithography

X-ray reduction exposure apparatus and device manufacturing meth

X-ray or gamma ray systems or devices – Specific application – Lithography

X-ray reduction projection exposure system of reflection type

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

X-ray reflectance measurement system with adjustable resolution

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

X-ray reflecting device

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

X-ray reflection method and apparatus for chemical analysis of t

X-ray or gamma ray systems or devices – Specific application – Lithography

X-ray reflective mask and system for image formation with use of

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

X-Ray reflective optical elements

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

X-ray reflectivity measurement

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

X-ray reflectivity system with variable spot

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

X-ray reflectometer

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

X-ray reflectometer

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

X-ray reflectometer

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

X-ray reflectometry of thin film layers with enhanced accuracy

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

X-ray reflectometry of thin film layers with enhanced accuracy

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

X-ray reflectometry system with multiple sample holder and...