X-ray or gamma ray systems or devices – Specific application – Absorption
Reexamination Certificate
2008-07-15
2008-07-15
Ho, Allen C. (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Absorption
C378S087000, C378S088000
Reexamination Certificate
active
07400701
ABSTRACT:
A system and method for inspecting an object with multiple sources of penetrating radiation. Irradiation of the inspected object by the sources is temporally sequenced such that the source of detected scattered radiation is unambiguous. Thus, multiple views of the inspected object may be obtained and image quality may be enhanced, even in a compact geometry in which the beams are substantially coplanar.
REFERENCES:
patent: 4799247 (1989-01-01), Annis et al.
patent: 5181234 (1993-01-01), Smith
patent: 5638420 (1997-06-01), Armistead
patent: 5696806 (1997-12-01), Grodzins et al.
patent: 5930326 (1999-07-01), Rothschild et al.
patent: 6018562 (2000-01-01), Willson
patent: 6081580 (2000-06-01), Grodzins et al.
patent: 6094472 (2000-07-01), Smith
patent: 6151381 (2000-11-01), Grodzins et al.
patent: 6192104 (2001-02-01), Adams et al.
patent: 6212251 (2001-04-01), Tomura et al.
patent: 6249567 (2001-06-01), Rothschild et al.
patent: 6421420 (2002-07-01), Grodzins
patent: 6442233 (2002-08-01), Grodzins et al.
patent: 6459761 (2002-10-01), Grodzins et al.
patent: 6473487 (2002-10-01), Le
patent: 6556653 (2003-04-01), Hussein
patent: 6567496 (2003-05-01), Sychev
patent: 6876719 (2005-04-01), Ozaki
patent: 6879657 (2005-04-01), Hoffman
patent: 7103137 (2006-09-01), Seppi et al.
patent: WO 98/02763 (1998-01-01), None
American Science and Engineering, Inc.
Bromberg & Sunstein LLP
Ho Allen C.
LandOfFree
Backscatter inspection portal does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Backscatter inspection portal, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Backscatter inspection portal will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2747124