X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate
2007-10-09
2007-10-09
Thomas, Courtney (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
C378S145000
Reexamination Certificate
active
11449208
ABSTRACT:
An x-ray beam conditioning system with a first diffractive element and a second diffractive element. The two diffractive elements are arranged in a sequential configuration, and one of the diffractive elements is a crystal. The other diffractive element may be a multilayer optic.
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Harada Jimpei
Verman Boris
Brinks Hofer Gilson & Lione
Osmic, Inc.
Thomas Courtney
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