X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate
2005-09-27
2005-09-27
Church, Craig E. (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
C378S156000, C378S002000, C382S281000, C382S283000
Reexamination Certificate
active
06950495
ABSTRACT:
Backscatter imaging using Hadamard transform masking includes an area x-ray source with alternating, masked, Hadamard transform patterns. The total backscatter signal from a target for each pair of corresponding masks is recorded. The difference in signal strengths for each pair of corresponding masks is a direct measurement of the Hadamard transform coefficient for that mask. An image of the target is formed by performing an inverse discrete Hadamard transform on the complete matrix of coefficients.
REFERENCES:
patent: 3748470 (1973-07-01), Barrett
patent: 3775602 (1973-11-01), Alexandridis et al.
patent: 3936639 (1976-02-01), Barrett
patent: 3969699 (1976-07-01), McGlaughlin
patent: 3982227 (1976-09-01), Joynson et al.
patent: 4005385 (1977-01-01), Joynson et al.
patent: 4075483 (1978-02-01), Tancrell et al.
patent: 4241404 (1980-12-01), Lux
patent: 4549212 (1985-10-01), Bayer
patent: 4621337 (1986-11-01), Cates et al.
patent: 4809312 (1989-02-01), Annis
patent: 4819256 (1989-04-01), Annis et al.
patent: 4974247 (1990-11-01), Friddell
patent: 5033073 (1991-07-01), Friddell
patent: 5157743 (1992-10-01), Maeda et al.
patent: 5181234 (1993-01-01), Smith
patent: 5247354 (1993-09-01), Nakajima
patent: 5293434 (1994-03-01), Feig et al.
patent: 5606165 (1997-02-01), Chiou et al.
patent: 5926488 (1999-07-01), Khayrallah
patent: 6094472 (2000-07-01), Smith
patent: 6205195 (2001-03-01), Lanza
patent: 6370222 (2002-04-01), Cornick, Jr.
patent: 6473487 (2002-10-01), Le
patent: 6487236 (2002-11-01), Iwamatsu et al.
patent: 2002/0028021 (2002-03-01), Foote et al.
patent: 2002/0080760 (2002-06-01), Anja et al.
patent: 2003/0202634 (2003-10-01), Gerchberg
patent: 2004/0095626 (2004-05-01), Brady
patent: 0920185 (1999-06-01), None
patent: 1012986 (2000-06-01), None
patent: 1024456 (2000-08-01), None
patent: 1173027 (2002-01-01), None
patent: WO 8500906 (1985-02-01), None
patent: WO 8500908 (1985-02-01), None
patent: WO 9202937 (1992-02-01), None
patent: WO 9909655 (1999-02-01), None
patent: WO 00/01157 (1999-06-01), None
patent: WO 00/49428 (2000-08-01), None
U.S. Appl. No. 07/124,616, filed Nov. 24, 1987, Application was abandoned.
Decker, J.A.: Hadamard-Transform Image Scanning; Applied Optics, vol. 9 No. 6, Jun. 1970, 4 pages.
Appendix B, X-Ray-Based Detection Systems; Technology Against Terrorism: The Federal Effort;Internet article: 4 pages, May 13, 2003: http://216.239.37.104/searc.../913909.pdf.
AS&E Announces Breakthrough in X-Ray Inspection Technology; Press Release; Internet Article; 2 pages, www.as-e.com/about/2001/070901.html; May 13, 2003.
AS&E Technology; Internet article; May 13, 2003; 2 pages, www.as-e.com/technogy/backscatter.html.
Bossi, RH, Friddell, K.D., Nelson, J.M.; Backscatter X-Ray Imaging; Materials Evaluation; Vol. 46, No. 11, Oct. 1989: 10 pages.
Nelson James M.
Shepherd William B.
Church Craig E.
Sucheski Krystyna
The Boeing Company
Thompson & Coburn LLP
LandOfFree
Backscatter imaging using Hadamard transform masking does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Backscatter imaging using Hadamard transform masking, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Backscatter imaging using Hadamard transform masking will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3439078