Backscatter imaging using Hadamard transform masking

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Reexamination Certificate

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C378S156000, C378S002000, C382S281000, C382S283000

Reexamination Certificate

active

06950495

ABSTRACT:
Backscatter imaging using Hadamard transform masking includes an area x-ray source with alternating, masked, Hadamard transform patterns. The total backscatter signal from a target for each pair of corresponding masks is recorded. The difference in signal strengths for each pair of corresponding masks is a direct measurement of the Hadamard transform coefficient for that mask. An image of the target is formed by performing an inverse discrete Hadamard transform on the complete matrix of coefficients.

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