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Apparatuses and methods for non-destructive inspection

X-ray or gamma ray systems or devices – Specific application – Telescope or microscope
Reexamination Certificate

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Condenser zone plate illumination for point X-ray sources

X-ray or gamma ray systems or devices – Specific application – Telescope or microscope
Reexamination Certificate

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Condenser-monochromator arrangement for X-radiation

X-ray or gamma ray systems or devices – Specific application – Telescope or microscope
Patent

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Cryotomography x-ray microscopy state

X-ray or gamma ray systems or devices – Specific application – Telescope or microscope
Reexamination Certificate

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Extended range X-ray telescope

X-ray or gamma ray systems or devices – Specific application – Telescope or microscope
Patent

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Hard x-ray magnification apparatus and method with submicrometer

X-ray or gamma ray systems or devices – Specific application – Telescope or microscope
Patent

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Hard x-ray polycapillary telescope

X-ray or gamma ray systems or devices – Specific application – Telescope or microscope
Patent

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High resolution x-ray imaging of very small objects

X-ray or gamma ray systems or devices – Specific application – Telescope or microscope
Reexamination Certificate

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High resolution x-ray imaging of very small objects

X-ray or gamma ray systems or devices – Specific application – Telescope or microscope
Patent

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Image formation-type soft X-ray microscopic apparatus

X-ray or gamma ray systems or devices – Specific application – Telescope or microscope
Patent

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Imaging type x-ray microscope apparatus with Schwarzschild optic

X-ray or gamma ray systems or devices – Specific application – Telescope or microscope
Patent

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Method and apparatus for investigating materials with X-rays

X-ray or gamma ray systems or devices – Specific application – Telescope or microscope
Patent

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Method and apparatus for observing a specimen using an X-ray mic

X-ray or gamma ray systems or devices – Specific application – Telescope or microscope
Patent

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Method and apparatus for X-ray and extreme ultraviolet inspectio

X-ray or gamma ray systems or devices – Specific application – Telescope or microscope
Patent

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Method and device for producing phase-contrast images

X-ray or gamma ray systems or devices – Specific application – Telescope or microscope
Patent

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Method for examining structures on a semiconductor substrate

X-ray or gamma ray systems or devices – Specific application – Telescope or microscope
Reexamination Certificate

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Multi-layered mirror

X-ray or gamma ray systems or devices – Specific application – Telescope or microscope
Patent

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Multispectral glancing incidence X-ray telescope

X-ray or gamma ray systems or devices – Specific application – Telescope or microscope
Patent

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Multispectral variable magnification glancing incidence x-ray te

X-ray or gamma ray systems or devices – Specific application – Telescope or microscope
Patent

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Optical alignment of X-ray microanalyzers

X-ray or gamma ray systems or devices – Specific application – Telescope or microscope
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