Method and apparatus for investigating materials with X-rays

Details Method and apparatus for investigating materials with X-rays Method and apparatus for investigating materials with X-rays

1990-06-20

1991-08-27

Westin, Edward P.

X-ray or gamma ray systems or devices

Specific application

Telescope or microscope

378 45, G21K 700

Patent

active

050440012

ABSTRACT:
A method of investigating materials, especially biological specimens, utilizes a focused accelerated beam of electrons within an evacuated chamber, striking a metal foil within the chamber and exposing a specimen outside the evacuated chamber to x-rays generated in the metal foil. The apparatus of the invention functions as an x-ray microscope and in a preferred embodiment, as a scanning x-ray microscope.

REFERENCES:
patent: 2843751 (1958-07-01), Botty et al.
patent: 4382181 (1983-05-01), Wang
patent: 4588891 (1986-05-01), Saito
patent: 4988872 (1991-01-01), Nagatsuka et al.
patent: 4990778 (1991-02-01), Norioka

Affiliated with

Also associated with

Rating

Method and apparatus for investigating materials with X-rays does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for investigating materials with X-rays, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for investigating materials with X-rays will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1420593