Method and device for producing phase-contrast images

X-ray or gamma ray systems or devices – Specific application – Telescope or microscope

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350509, 350510, G21K 700

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active

049531883

ABSTRACT:
For producing phase-contrast images with a microscope which scans the object point-by-point with a beam of illuminating radiation, the illuminating radiation is focused by an objective (31, 32) including a phase-shifting element (33) of preselective geometry. A radiation-sensitive detector (36) is positioned directly behind the object plane (34), seen in the direction of the light; and the shape of the radiation-sensitive area of the detector is adapted to encompass the path of the radiation passing through the geometry of the phase-shifting element (33) of the objective (31, 32), e.g., where the phase-shifting elements (33) comprise an annular aperture, an appropriately conforming annular diaphragm (35) is arranged in front of the detector (36). The advantage of this arrangement is that it does not use any radiation-collecting lens system between the object plane (34) and the detector (36).

REFERENCES:
patent: 3628848 (1971-12-01), Nomarsle
"X-Ray Scanning Pinhole Microscope", M. Luukkala, Electronics Letters, Nov. 14, 1974, vol. 10, p. 481.
"Optical fluorescence microscopy in three dimensions: microtomoscopy", "Journal of Microscopy", vol. 138, Pt. 1, Apr. 1985, pp. 29-34, by R. W. Wijnaendts van Resandt et al.
"Laser Scan Microscope", Carl Zeiss publication W41-910e, West Germany (Oberkochen).
ABC der Optik, editor Karl Mutze, Verlag Werner Dausien, Hanaul Main, 1961, pp. 634-638, West Germany.
Theory and Practice of Scanning Optical Microscopy, Academic Press, 1984, pp. 79-93, 100-110, by T. Wilson and C. Sheppard.
"Circular Array", EG&G Reticon, RO0720B, Aug. 1987.
"Self-Scanned Circular Photodiode Array", EG&G Reticon, RO0064N, May 1986.
"Soft X-Ray Optics and Technology", "Proceedings of SPIE-The International Society for Optical Engineering", vol. 733, 1986, pp. 496-503, (Peter Guttmann) Berlin, W. Germany.

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