X-ray or gamma ray systems or devices – Specific application – Telescope or microscope
Reexamination Certificate
2005-08-05
2008-12-16
Song, Hoon (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Telescope or microscope
C378S070000
Reexamination Certificate
active
07466796
ABSTRACT:
An improved short-wavelength microscope is described in which a specimen sample is placed between a condenser zone plate lens and an objective zone plate lens so that the specimen is aligned with a diffraction order of the condenser zone plate lens that is greater than one and proximal to the condenser zone plate.
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Caesar Rivise Bernstein Cohen & Pokotilow Ltd.
Gatan Inc.
Song Hoon
LandOfFree
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