Accurate thickness measurement of thin conductive film

Apparatus and method for detecting defects in insulative layers

Apparatus and method for detecting soft breakdown of a...

Apparatus and method for determining doping concentration of...

Apparatus and method for enhanced voltage contrast analysis

Apparatus and method for fabricating arrays of atomic-scale...

Apparatus and method for testing defects

Apparatus and method for testing defects

Apparatus and methods for monitoring self-aligned contact...

Apparatus and methods of semiconductor packages having...

Apparatus for automated pillar layout and method for implementin

Apparatus for detecting defect sizes in polysilicon and source-d

Apparatus to evaluate hot carrier injection performance...

Automated method of controlling critical dimensions of...

Body-tied-to-source partially depleted SOI MOSFET

Bond wire tuning of RF power transistors and amplifiers

Calibration standard for critical dimension verification of...

Characteristic evaluation apparatus for insulated gate type...

Characterization methodology for the thin gate oxide device

Chemical mechanical polishing test structures and methods...