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Manipulator for rotating and examining small spheres

Optics: measuring and testing – Sample – specimen – or standard holder or support
Patent

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Manual densitometer with manully operated dial

Optics: measuring and testing – By shade or color
Patent

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Manual device for the detection of optical reflection properties

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

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Manual device for the determination or measurement of photometri

Optics: measuring and testing – Sample – specimen – or standard holder or support
Patent

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Manual wavelength adjustment for a microprocessor based spectrop

Optics: measuring and testing – By dispersed light spectroscopy – With monochromator structure
Patent

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Manually portable reflectance spectrometer

Optics: measuring and testing – By shade or color
Patent

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Manufacture defect analyzer with detecting function and...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Manufacture defect analyzer with detecting function and...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Manufacturing method for a field-effect transistor,...

Optics: measuring and testing – Dimension – Thickness
Reexamination Certificate

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Manufacturing method including near-field optical microscopic ex

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Manufacturing method of semiconductor substrate and method...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Manufacturing method of semiconductor substrate and method...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Manufacturing method of semiconductor substrate and method...

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Reexamination Certificate

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Manufacturing method of semiconductor substrate and method...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Manufacturing method of semiconductor substrative and method and

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Mapping air contaminants using path-integrated optical...

Optics: measuring and testing – By light interference
Reexamination Certificate

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Mapping-measurement apparatus

Optics: measuring and testing – For light transmission or absorption – Of photographic film
Reexamination Certificate

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Mark detection method, exposure method, device manufacturing...

Optics: measuring and testing – By alignment in lateral direction – With light detector
Reexamination Certificate

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Mark detection method, optical system and mark position...

Optics: measuring and testing – By light interference – Having light beams of different frequencies
Reexamination Certificate

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Mark for alignment and overlay, mask having the same, and...

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Reexamination Certificate

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