Mapping-measurement apparatus

Details Mapping-measurement apparatus Mapping-measurement apparatus

2007-05-29

2007-05-29

Lauchman, Layla G. (Department: 2877)

Optics: measuring and testing

For light transmission or absorption

Of photographic film

C356S445000

Reexamination Certificate

active

10970518

ABSTRACT:
A mapping-measurement apparatus includes a light illumination unit, a photodetector for detecting, through an aperture, reflection light or transmission light from a sample, and adjustable scanning mirrors on the illumination and detection sides of the sample, each mirror having two independent rotational axes about which they can be independently rotated by a controller. The aperture restricts light incident on the photodetector from a predetermined portion of the sample surface.

REFERENCES:
patent: 3180217 (1965-04-01), Argyle et al.
patent: 3705755 (1972-12-01), Baer
patent: 5978095 (1999-11-01), Tanaami
patent: 6633384 (2003-10-01), Drake et al.
patent: 04-110960 (1992-09-01), None
patent: 3329018 (2002-07-01), None
English Translation of the Abstract of Japanese Publication No. 04-110960, published Sep. 25, 1992.
Shimadzu Corp.; title Infrared Microscope; English translation of the Abstract of Japanese Patent No. 3329018, issued Jul. 19, 2002; Publication No. 07-063994, published Mar. 10, 1995; Application No. 05-234025, filed Aug. 25, 1993.

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