Manufacture defect analyzer with detecting function and...

Details Manufacture defect analyzer with detecting function and... Manufacture defect analyzer with detecting function and...

2008-07-01

2008-07-01

Pham, Hoa Q (Department: 2886)

Optics: measuring and testing

Inspection of flaws or impurities

Surface condition

C324S755090

Reexamination Certificate

active

07394533

ABSTRACT:
A manufacture defect analyzer (MDA) with a detecting function and inspecting method thereof are provided. The manufacture defect analyzer with a detecting function is for checking a to-be-inspected circuit board comprising a socket. The socket has an upper cover. The manufacture defect analyzer comprises a carrier, a detecting apparatus and an analyzer. The carrier is for supporting the to-be-inspected circuit board. The detecting apparatus corresponds to the socket and is disposed on the carrier and detects whether the upper cover is open. If the upper cover is open, then an open signal is outputted. After receiving the open signal, the analyzer is electrically connected to the socket to check whether the socket has any manufacture defect or not.

REFERENCES:
patent: 4264202 (1981-04-01), Gugliotta et al.
patent: 6388457 (2002-05-01), Loh et al.

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