Search
Selected: F

Focus error detector

Optics: measuring and testing – Focal position of light source
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Focus measurement in projection exposure apparatus

Optics: measuring and testing – Position or displacement – Position transverse to viewing axis
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Focus monitor for alternating phase shifted masks

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Focus processing with the distance of different target wheels

Optics: measuring and testing – Lens or reflective image former testing
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Focus spot size controller for a variable depth range camera

Optics: measuring and testing – Range or remote distance finding – With photodetection
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Focus system

Optics: measuring and testing – Range or remote distance finding – Triangulation ranging to a point with two or more projected...
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Focus test mask for projection exposure system, focus monitoring

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Focus tracking system

Optics: measuring and testing – By polarized light examination – With birefringent element
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Focused beam spectroscopic ellipsometry method and system

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Focused beam spectroscopic ellipsometry method and system

Optics: measuring and testing – By polarized light examination – Of surface reflection
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Focused beam spectroscopic ellipsometry method and system

Optics: measuring and testing – By polarized light examination – Of surface reflection
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Focused laser light turbidity sensor

Optics: measuring and testing – By particle light scattering – With photocell detection
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Focused laser light turbidity sensor apparatus and method...

Optics: measuring and testing – By particle light scattering – With photocell detection
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Focused, single strand, optical fiber rotational alignment image

Optics: measuring and testing – Angle measuring or angular axial alignment – Sides of angle or axes being aligned transverse to optical...
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Focused-beam ellipsometer

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Focusing controller

Optics: measuring and testing – Range or remote distance finding – With photodetection
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Focusing device for optical system

Optics: measuring and testing – Focal position of light source
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Focusing for optical print heads

Optics: measuring and testing – Focal position of light source
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Focusing method and apparatus for a surveying instrument having

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Focusing method for interferometer

Optics: measuring and testing – By polarized light examination – With birefringent element
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0
  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.