LandOfFree - US Patents - Listing for Optics: measuring and testing,Inspection of flaws or impurities

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System and method for inspecting a light-management film and...

Optics: measuring and testing – Inspection of flaws or impurities – Transparent or translucent material

Reexamination Certificate

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System and method for inspecting a light-management film and...

Optics: measuring and testing – Inspection of flaws or impurities – Transparent or translucent material

Reexamination Certificate

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System and method for inspecting a mower

Optics: measuring and testing – Inspection of flaws or impurities

Reexamination Certificate

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System and method for inspecting a mower

Optics: measuring and testing – Inspection of flaws or impurities

Reexamination Certificate

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System and method for inspecting a workpiece surface by...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition

Reexamination Certificate

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System and method for inspecting a workpiece surface using...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition

Reexamination Certificate

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System and method for inspecting a workpiece surface using...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition

Reexamination Certificate

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System and method for inspecting an object using structured...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition

Reexamination Certificate

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System and method for inspecting bumped wafers

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition

Reexamination Certificate

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System and method for inspecting pattern defect

Optics: measuring and testing – Inspection of flaws or impurities

Patent

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System and method for inspecting semiconductor wafers

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition

Patent

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System and method for inspecting semiconductor wafers

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition

Reexamination Certificate

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System and method for inspecting the structural integrity of...

Optics: measuring and testing – Inspection of flaws or impurities – Transparent or translucent material

Reexamination Certificate

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System and method for inspecting wafers in a laser marking...

Optics: measuring and testing – Inspection of flaws or impurities

Reexamination Certificate

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System and method for inspecting wafers in a laser marking...

Optics: measuring and testing – Inspection of flaws or impurities

Reexamination Certificate

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System and method for inspection of a substrate that has a...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition

Reexamination Certificate

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System and method for machine vision analysis of an object...

Optics: measuring and testing – Inspection of flaws or impurities – Containers or enclosures

Reexamination Certificate

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System and method for measuring crazing in a transparency

Optics: measuring and testing – Inspection of flaws or impurities – Transparent or translucent material

Patent

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System and method for measuring properties of a...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition

Reexamination Certificate

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System and method for measuring the permeability of a material

Optics: measuring and testing – Inspection of flaws or impurities – Textile inspection

Reexamination Certificate

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