Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate
2007-10-23
2007-10-23
Pham, Hoa Q. (Department: 2886)
Optics: measuring and testing
Inspection of flaws or impurities
Surface condition
C356S600000
Reexamination Certificate
active
11311926
ABSTRACT:
A method for inspecting a surface of a workpiece comprises scanning an incident beam on the surface of the workpiece to impinge thereon to create reflected light and scattered light comprising light that is scattered from the surface upon impingement thereon by the incident beam; and determining an extent of a contribution to surface roughness from a component of the surface, with the component having a surface roughness spatial frequency range.
REFERENCES:
patent: 4846578 (1989-07-01), Morita et al.
patent: 2006/0192950 (2006-08-01), Judell et al.
patent: 2007/0024998 (2007-02-01), Bills et al.
patent: 4230068 (1994-03-01), None
Akutsu James
Tiemeyer Timothy R.
Caven & Aghevli LLC
KLA-Tencor Technologies Corporation
Pham Hoa Q.
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